Dynamic Testing of High-Speed ADCs, Part 2

Abstract:Analog-to-digitalconverters(ADCs)representthelinkbetweenanaloganddigitalworldsinreceivers,testequipmentandotherelectronicdevices.AsoutlinedinPart1ofthisarticleseries,anumberofkeydynamicparametersprovideanaccuratecorrelationofthedynamicperformancetobeexpectedfromagivenADC.Part2ofthisarticleseriescoverssomeofthesetupconfigurations,equipmentrecommendationsandmeasurementproceduresfortestingthedynamicspecificationsofhigh-speedADCs.Maxim>DesignSupport>TechnicalDocuments>Tutorials>A/DandD/AConversion/SamplingCircuits>APP729Maxim>DesignSupport>TechnicalDocuments>Tutorials>Basestations/WirelessInfrastructure>APP729Maxim>DesignSupport>TechnicalDocuments>Tutorials>High-SpeedSignalProcessing>APP729Keywords:analogtodigitalconverters,ADCs,high-speedADC,SNR,SINAD,ENOB,THD,SFDR,two-toneIMD,multi-toneIMD,clockjitter,FFT,spectrum,windowfunctions,spectralleakage,frequencybin,bins,coherentsampling,hanning,hamming,flattopJul22,2002TUTORIAL729DynamicTestingofHigh-SpeedADCs,Part2Jul22,2002Abstract:Analog-to-digital