文章目录摘要INTRODUCTIONRELATED WORKSPROPOSED METHODA. ROI ExtractionB. LBP Feature Extraction and K-means lustering in Bag of Features (BOF)C. SVM Framework for Defect InspectionEXPERIMENTAL RESULTSA. Comparison on Various Algorithms of ROI ExtractionB.基于不同特征提取方法的性能比较C.Detection Speed Comparison over TSE