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Guidelines_for_Board_Part1.pdf
Guidelines for Board Design For Test (DFT) Based on Boundary Scan Part 1
Guidelines_for_Board_Part2.pdf
Guidelines for Board Design For Test (DFT) Based on Boundary Scan Part 2
board_test_strategies.pdf
Whitepaper: Comparing Board Test Strategies How can CPU Emulation help?
Guidelines_for_Device.pdf
边扫测试器件篇，讲述边扫测试的器件选择和优化设计GuidelinesforChip
DesignForTest(DFT)
BasedonBoundaryScanorJTAG
BoundaryScan_Testing_with_FPGAs.pdf
Boundary-Scan_Testing_with_FPGAs，如何使用FPGA来实现边界扫描测试
JTAG边界扫描介绍
JTAG(Joint Test Action Group联合测试行动小组)是一种国际标准测试协议IEEE 1149.1 兼容），主要用于芯片内部测试。现在多数的高级器件都支持 JTAG 协议，如 DSP、 FPGA 器件等。标准的 JTAG 接口是 4 线： TMS、 TCK、 TDI、 TDO，分